| Abstract |
In this paper, the short-circuit (SC) performance of two different SiC MOSFETs is experimentally investigated for different input voltages, biasing voltages and case temperatures. The measurement results are compared to simulations, and a good agreement is achieved. For fault handling, two different overcurrent protection (OCP) circuits are designed and applied to the SiC MOSFETs. The desaturation method is successfully tested with a hardware solution substituting the blanking time delay. The second method is based on sensing the voltage drop across the parasitic inductance at the source pin. The experimental and simulation results show that both OCP methods have the capability to detect a short circuit condition in the SiC MOSFET within safe SC time avoiding device failure. |
