Abstract |
This paper discusses an elaborated study about the design of Junction-Barrier Schottky (JBS)diodes regarding the width (w) and spacing (s) of the implanted p+ pattern, utilizing epitaxial drift-layer specifications (4H-SiC) suitable for 1.7 kV applications. The impact of the w/s design-ratio onthe blocking characteristics, the unipolar ON-state performance as well as moderation of surge currentevents are investigated. Finally, we report experimental results on successfully manufactured 1.7 kVJBS power-rectifiers demonstrating the practical validity of our numerical approach. |