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   Diode snappiness from a user's perspective   [View] 
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 Author(s)   JORGE MARI 
 Abstract   This paper deals with reverse recovery and snappiness in high voltage PiN diodes as the ones currently used in high power electronics applications. It suggests a practical quantitative definition for the occurrence of snappiness and investigates unusual phenomena that might occur during reverse recovery. 
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Filename:0518-epe2015-full-08304365.pdf
Filesize:595.9 KB
 Type   Members Only 
 Date   Last modified 2016-06-08 by System