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Diode snappiness from a user's perspective
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Author(s) |
JORGE MARI |
Abstract |
This paper deals with reverse recovery and snappiness in high voltage PiN diodes as the ones currently used in high power electronics applications. It suggests a practical quantitative definition for the occurrence of snappiness and investigates unusual phenomena that might occur during reverse recovery. |
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Filename: | 0518-epe2015-full-08304365.pdf |
Filesize: | 595.9 KB |
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Type |
Members Only |
Date |
Last modified 2016-06-08 by System |
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