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A feasibility study of using gate-emitter voltage method to estimate IGBT online junction temperature in practical applications
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| Author(s) |
Gernot J. RIEDEL |
| Abstract |
The paper presents the feasibility of using gate-emitter voltage during IGBT turn-off in estimating the junction temperature of semiconductor chips in IGBT modules in real-time application. It is shown that the chosen parameter has negligible module and measurement circuit variation once calibrated and has been implemented successfully in a converter. |
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| Filename: | 0242-epe2015-full-10141777.pdf |
| Filesize: | 640.2 KB |
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| Type |
Members Only |
| Date |
Last modified 2016-06-08 by System |
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