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   COMPARISON OF PT AND NPT CELL CONCEPT FOR 600V IGBTs   [View] 
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 Author(s)   R. Siemieniec; M. Netzel; R. Herzer 
 Abstract   This paper presents a comparison study of PT- and NPT-IGBTs with a blocking voltage of 600V using two dimensional device simulation. The devices are simulated within a realistic external circuit in order to study the tradeoff between total power losses and switching frequency at various temperatures. The results are compared with published data from available PT-IGBTs. It is concluded that the 600V NPT structure is able to compete with the PT structure, but it needs an advanced manufacturing technology for thin wafer handling. 
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Filename:Unnamed file
Filesize:436.1 KB
 Type   Members Only 
 Date   Last modified 2016-03-09 by System