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EFFECT OF THE PHYSICAL STRUCTURE ON THE RECOVERY SOFTNESS OF PIN DIODES: EXPERIMENTAL AND NUMERICAL ANALYSIS
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| Author(s) |
M. Pasqualetti; M. Portesine; R. Scicolone; B. Zerbinati; R. Menozzi; A. Bellini; P. Cova |
| Abstract |
In order to investigate the effect of physical and structural features on the softness of PIN power fast diode reverse recovery, a large matrix of test devices has been designed
covering the relevant ranges of resistivity, intrinsic base width and lifetime. Experimental data have been successfully compared with simulated results obtained with a drift diffusion
numerical simulator. |
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| Filename: | Unnamed file |
| Filesize: | 322.9 KB |
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| Type |
Members Only |
| Date |
Last modified 2016-03-09 by System |
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