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Measurement of a Complete HV IGBT I-V-Characteristic up to the Breakdown Point
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| Author(s) |
Thomas BASLER, Josef LUTZ, Riteshkumar BHOJANI, Roland JAKOB |
| Abstract |
This paper describes how to measure the complete output characteristic of a high-voltage IGBT non- destructively up to the breakdown point and beyond. Hereby, a deep knowledge of the IGBT behaviour at high voltages and saturation currents is gained. To construct the complete characteristic, short-circuit and curve-tracer measurements are combined. The results are compared and recapitulated with semicon- ductor simulations of IGBT models fitted to experimental characteristics. |
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| Filename: | 0650-epe2013-full-00245668.pdf |
| Filesize: | 1.103 MB |
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| Type |
Members Only |
| Date |
Last modified 2014-02-09 by System |
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