| |
Influence of IGBT Current Rating on the Thermal Cycling Lifetime of a Power Electronic Active Rectifier in a Direct Wave Energy Converter
| [View]
[Download]
|
| Author(s) |
Thibaut KOVALTCHOUK, Judicael AUBRY, Bernard MULTON, Hamid BEN AHMED |
| Abstract |
Direct Wave Energy Converters offer high reliability potential, which is a key factor in offshore environments, yet their electrical power produced is strongly pulsating. The t hermal cycling of their power electronic switches (considered here to be I nsulated Gate Bipolar Transistors, IGBT) may reduce the lifetime of the power electronic converter. This study proposes a generic design method for choosing both the IGBT current rating and the heatsink thermal resistance in order to satisfy a reliability constraint. A parametric electro-thermal model has thus been developed to determine the junction temperature time series. Moreover, a rainflow cycle counting method is introduced for the reliability analysis and lifetime prediction using two aging models, one for wire bonds, the other for the solder joint of the chip. |
| Download |
| Filename: | 0258-epe2013-full-23490543.pdf |
| Filesize: | 1.101 MB |
|
| Type |
Members Only |
| Date |
Last modified 2014-02-09 by System |
| |
 |