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   High-Speed Gate Driver Design for Testing and Characterizing WBG Power Transistors    [View] 
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 Author(s)   Nasser Badawi, Philipp Knieling, Sibylle Dieckerhoff 
 Abstract   High-Speed Gate Driver Design for Testing and Characterizing WBG Power Transistors  
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Filename:LS6d(T1)-512.pdf
Filesize:1.023 MB
 Type   Members Only 
 Date   Last modified 2013-04-22 by System