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   Trench isolation technique for Reverse Blocking IGBT using Boron Nitride doping wafers   [View] 
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 Author(s)   MIQUEL VELLVEHI, JOSE LUIS GALVEZ, XAVIER PERPINYA, XAVIER JORDA, PHILIPPE GODIGNON, JOSE MILLAN 
 Abstract   A new fabrication process for IGBT devices with reverse blocking capability (RB-IGBT) is presented in this paper. The trench isolation technique which provides the reverse blocking capability has been implemented using solid source as doping technique (Boron doping wafers), resulting in a low-cost process in both starting material and time-consuming aspects. The feasibility of the fabrication technique has been demonstrated with the electrical measurements of the fabricated devices. 
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Filename:0929-epe2009-full-12160503.pdf
Filesize:261.5 KB
 Type   Members Only 
 Date   Last modified 2010-01-27 by System