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Trench isolation technique for Reverse Blocking IGBT using Boron Nitride doping wafers
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Author(s) |
MIQUEL VELLVEHI, JOSE LUIS GALVEZ, XAVIER PERPINYA, XAVIER JORDA, PHILIPPE GODIGNON, JOSE MILLAN |
Abstract |
A new fabrication process for IGBT devices with reverse blocking capability (RB-IGBT) is presented in this paper. The trench isolation technique which provides the reverse blocking capability has been implemented using solid source as doping technique (Boron doping wafers), resulting in a low-cost process in both starting material and time-consuming aspects. The feasibility of the fabrication technique has been demonstrated with the electrical measurements of the fabricated devices. |
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Filename: | 0929-epe2009-full-12160503.pdf |
Filesize: | 261.5 KB |
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Type |
Members Only |
Date |
Last modified 2010-01-27 by System |
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