| Filename: | 0478-epe2009-full-14320967.pdf |
| Filesize: | 259.1 KB |
| Electro-thermal behaviour of a SiC JFET stressed by lightning-induced overvoltages | ||||||
| Author(s) | Dominique BERGOGNE | |||||
| Abstract | JFET are experimentally stressed to provide data for modelling, inverter and driver design. The experimental set-up is described. A surge generator is built and a SiC JFET is stressed. During the stress, a temperature estimation is done at increasing time steps, in order to obtain the full thermal response versus time. | |||||
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| Type | Members Only | |||||
| Date | Last modified 2010-01-27 by System | |||||
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