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Closed Loop Temperature and Repetition Rate Control for Accelerated Pulse Stress Testing of Smart Power Switches
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| Author(s) |
Hans-Peter KREUTER, Michael GLAVANOVICS, Christoph SCHREIBER |
| Abstract |
Cyclic stress tests for smart power switches require a significant effort in test resources, particularly in test time, to provide statistically valid life time data. To address this issue we present a novel accelerated pulse stress test method to speed up the qualification process of smart power switches. A closed loop repetition rate controller employing individual temperature sensors stabilizes device operating points while preserving standardized test conditions. Temperature acquisition module and controller are implemented on a PXI-based system hosting a PC and an FPGA device. Finally the method is experimentally verified and lifetime data are compared to standard open loop test results. |
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| Filename: | 0511-epe2009-full-09432290.pdf |
| Filesize: | 570 KB |
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| Type |
Members Only |
| Date |
Last modified 2010-01-27 by System |
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